Oscillation-based testing method for detecting switch faults in High-Q SC biquad filters
نویسندگان
چکیده
منابع مشابه
Practical Considerations in Oscillation Based Test of SC Biquad Filters
Transformation of different types of switched-capacitor (SC) biquad filter stages based on FleischerLaker biquad SC structure in order to support oscillation based testing (OBT) have been proposed. The derived solutions are based on the generic Fleischer-Laker biquad SC structure assuming ideal characteristics of the employed components. In this paper, we explore the operation of the proposed O...
متن کاملOscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration
In this paper, we explore general conditions for the oscillation based test of switched-capacitor biquad filter stages. Expressions describing the characteristics of a filter stage put into oscillation are derived and conditions for achieving oscillation by internal transformation of the filter stage are explored. Reconfiguration scheme based on the transformation of the biquad filter stage to ...
متن کاملTO-OTA based current-mode biquad filters
Abstract—In this paper, a general two-admittance current-mode circuit structure using triple-output OTA is explored to derive new second-order multi-function filters using OTAs with few extra current outputs and with/ without grounded capacitors. Biquads filters have been realized by using various admittances like OTA-simulated resistor, series and parallel OTA-C resonators in the proposed gene...
متن کاملTesting Biquad Filters under Parametric Shifts Using X-Y Zoning
Testing mixed-signal circuits is a difficult task due to defect modelling challenges, observability and controllability restrictions and ATE bandwidth limitations. In previous works, X-Y Zoning method has been proposed as a BIST technique for mixedsignal and analogue circuits. Some experiments showed its viability in detecting parametric deviations in analog cells. . In this paper the optimal X...
متن کاملDFT for digital detection of analog parametric faults in SC filters
Parametric faults are a significant cause of incorrect operation in analog circuits. Many design for test techniques for analog circuits are ineffective at detecting multiple parametric faults because either their accuracy is poor, or the circuit is not tested in the configuration in which it is used. We present a design for test (DFT) scheme that offers the accuracy needed to test high-quality...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Facta universitatis - series: Electronics and Energetics
سال: 2015
ISSN: 0353-3670,2217-5997
DOI: 10.2298/fuee1502223m